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[IEEE 2013 ACM/IEEE International Symposium on Empirical Software Engineering and Measurement (ESEM) - Baltimore, Maryland (2013.10.10-2013.10.11)] 2013 ACM / IEEE International Symposium on Empirical Software Engineering and Measurement - Incremental Estimation of Project Failure Risk with Naive Bayes Classifier

✍ Scribed by Mori, Toshiki; Tamura, Shurei; Kakui, Shingo

Book ID: 126607250
Publisher: IEEE
Year: 2013
Weight: 247 KB
Category: Article
ISBN: 0769550568
DOI: 10.1109/ESEM.2013.40

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