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[IEEE 2013 8th International Symposium on Advanced Topics in Electrical Engineering (ATEE) - Bucharest, Romania (2013.05.23-2013.05.25)] 2013 8TH INTERNATIONAL SYMPOSIUM ON ADVANCED TOPICS IN ELECTRICAL ENGINEERING (ATEE) - A novel ESD protection structure used to enhance the safety of the MOSFET integrated circuitry

✍ Scribed by Bicleanu, Dumitru-Paul; Nicuta, Ana-Maria; Salceanu, Alexandru

Book ID: 121295435
Publisher: IEEE
Year: 2013
Weight: 574 KB
Category: Article
ISBN: 1467359785
DOI: 10.1109/ATEE.2013.6563442

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