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[IEEE 2013 8th International Symposium on Advanced Topics in Electrical Engineering (ATEE) - Bucharest, Romania (2013.05.23-2013.05.25)] 2013 8TH INTERNATIONAL SYMPOSIUM ON ADVANCED TOPICS IN ELECTRICAL ENGINEERING (ATEE) - A novel ESD protection structure used to enhance the safety of the MOSFET integrated circuitry

โœ Scribed by Bicleanu, Dumitru-Paul; Nicuta, Ana-Maria; Salceanu, Alexandru


Book ID
121295435
Publisher
IEEE
Year
2013
Weight
574 KB
Category
Article
ISBN
1467359785

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