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[IEEE 2013 8th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS) - Abu Dhabi (2013.3.26-2013.3.28)] 2013 8th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS) - Robust polysilicon gate FinFET SRAM design using dynamic back-gate bias

✍ Scribed by Ebrahimi, B.; Afzali-Kusha, Ali; Sehatbakhsh, N.

Book ID: 121193741
Publisher: IEEE
Year: 2013
Weight: 271 KB
Category: Article
ISBN: 1467360384
DOI: 10.1109/DTIS.2013.6527801

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