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[IEEE 2013 6th International IEEE/EMBS Conference on Neural Engineering (NER) - San Diego, CA, USA (2013.11.6-2013.11.8)] 2013 6th International IEEE/EMBS Conference on Neural Engineering (NER) - Sample Entropy enhanced wavelet-ICA denoising technique for eye blink artifact removal from scalp EEG dataset

✍ Scribed by Mahajan, Ruhi; Morshed, Bashir I.

Book ID: 121803984
Publisher: IEEE
Year: 2013
Weight: 698 KB
Category: Article
ISBN: 1467319694
DOI: 10.1109/NER.2013.6696203

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