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[IEEE 2013 5th Asia Symposium on Quality Electronic Design (ASQED) - Penang, Malaysia (2013.08.26-2013.08.28)] Fifth Asia Symposium on Quality Electronic Design (ASQED 2013) - Totally self-checking (TSC) VLSI circuits using Scalable Error Detection Coding (SEDC) technique

✍ Scribed by Somasundaram, Natarajan; Mehdipour, Farhad; Lee, Jeong-A; Ramadass, N; Rao, Y V Ramana

Book ID: 121726067
Publisher: IEEE
Year: 2013
Weight: 255 KB
Category: Article
ISBN: 147991312X
DOI: 10.1109/ASQED.2013.6643567

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