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[IEEE 2013 26th International Conference on VLSI Design: concurrently with the 12th International Conference on Embedded Systems - Pune, India (2013.01.5-2013.01.10)] 2013 26th International Conference on VLSI Design and 2013 12th International Conference on Embedded Systems - Measuring Area-Complexity Using Boolean Difference

✍ Scribed by Kagliwal, Ankit; Balachandran, Shankar

Book ID: 120652778
Publisher: IEEE
Year: 2013
Weight: 284 KB
Category: Article
ISBN: 076954889X
DOI: 10.1109/VLSID.2013.195

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