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[IEEE 2013 25th International Symposium on Power Semiconductor Devices & IC's (ISPSD) - Kanazawa (2013.5.26-2013.5.30)] 2013 25th International Symposium on Power Semiconductor Devices & IC's (ISPSD) - Robustness of GaN vertical superjunction HEMT

✍ Scribed by Zhongda Li, ; Chow, T. Paul

Book ID: 124150266
Publisher: IEEE
Year: 2013
Weight: 913 KB
Category: Article
ISBN: 1467351369
DOI: 10.1109/ISPSD.2013.6694484

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