[IEEE 2013 25th International Conference
โฆ LIBER โฆ
[IEEE 2013 25th International Conference on Indium Phosphide and Related Materials (IPRM) - Kobe, Japan (2013.05.19-2013.05.23)] 2013 International Conference on Indium Phosphide and Related Materials (IPRM) - Analysis on channel thickness fluctuation scattering in InGaAs-OI MOSFETs
โ Scribed by Kim, S. H.; Yokoyama, M.; Nakane, R.; Ichikawa, O.; Osada, T.; Hata, M.; Takenaka, M.; Takagi, S.
- Book ID
- 124077263
- Publisher
- IEEE
- Year
- 2013
- Weight
- 584 KB
- Category
- Article
- ISBN
- 1467361313
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