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[IEEE 2013 14th Latin American Test Workshop - LATW - Cordoba, Argentina (2013.04.3-2013.04.5)] 2013 14th Latin American Test Workshop - LATW - Vertically-stacked silicon nanowire transistors with controllable polarity: A robustness study

โœ Scribed by Gaillardon, Pierre-Emmanuel; Ghasemzadeh, Hassan; De Micheli, Giovanni


Book ID
120970007
Publisher
IEEE
Year
2013
Weight
656 KB
Category
Article
ISBN
1479905968

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