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[IEEE 2013 14th International Symposium on Quality Electronic Design (ISQED 2013) - Santa Clara, CA (2013.3.4-2013.3.6)] International Symposium on Quality Electronic Design (ISQED) - Input-aware statistical timing analysis-based delay test pattern generation

✍ Scribed by Bao Liu, ; Lu Wang,

Book ID: 120817866
Publisher: IEEE
Year: 2013
Weight: 165 KB
Category: Article
ISBN: 1467349526
DOI: 10.1109/ISQED.2013.6523651

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