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[IEEE 2012 Second International Conference on Instrumentation, Measurement, Computer, Communication and Control (IMCCC) - Harbin City, Heilongjiang, China (2012.12.8-2012.12.10)] 2012 Second International Conference on Instrumentation, Measurement, Computer, Communication and Control - Testing Technology on Very Fast Transient Overvoltage in 500kV HGIS Intelligent Substation

✍ Scribed by He, Liu; You-Qun, Sun; Jian-Ping, Lie; Hao, Yan; Yi-Yun, Zhang; Chun-Ming, Zhao

Book ID: 120211847
Publisher: IEEE
Year: 2012
Weight: 219 KB
Category: Article
ISBN: 0769549357
DOI: 10.1109/IMCCC.2012.89

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