๐”– Bobbio Scriptorium
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[IEEE 2012 Prognostics and System Health Management Conference (PHM) - Beijing, China (2012.05.23-2012.05.25)] Proceedings of the IEEE 2012 Prognostics and System Health Management Conference (PHM-2012 Beijing) - Reliability research on power MOSFET using coupled electrical-thermal-mechanical analysis

โœ Scribed by Qiuyang Li, ; Guofu Zhai, ; Shujuan Wang,


Book ID
120212626
Publisher
IEEE
Year
2012
Weight
929 KB
Category
Article
ISBN
145771910X

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