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[IEEE 2012 Joint 6th Intl. Conference on Soft Computing and Intelligent Systems (SCIS) and 13th Intl. Symposium on Advanced Intelligent Systems (ISIS) - Kobe, Japan (2012.11.20-2012.11.24)] The 6th International Conference on Soft Computing and Intelligent Systems, and The 13th International Symposium on Advanced Intelligence Systems - Analysis of backscatter from chipless metal patch RFID using soft computing techniques

✍ Scribed by Chiba, Kyohei; Chakraborty, Goutam; Mukherjee, Somnath

Book ID: 121672007
Publisher: IEEE
Year: 2012
Weight: 793 KB
Category: Article
ISBN: 1467327417
DOI: 10.1109/SCIS-ISIS.2012.6505075

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