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[IEEE 2012 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) - Hsinchu (2012.04.23-2012.04.25)] Proceedings of Technical Program of 2012 VLSI Design, Automation and Test - A 1-V, 44.6 ppm/°C bandgap reference with CDS technique

✍ Scribed by Peng-Yu Chen, ; Soon-Jyh Chang, ; Chung-Ming Huang, ; Chin-Fu Lin,

Book ID: 121082747
Publisher: IEEE
Year: 2012
Weight: 843 KB
Category: Article
ISBN: 1457720795
DOI: 10.1109/VLSI-DAT.2012.6212660

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