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[IEEE 2012 International Symposium on Electromagnetic Compatibility - EMC EUROPE - Rome, Italy (2012.09.17-2012.09.21)] International Symposium on Electromagnetic Compatibility - EMC EUROPE - Skin-effect model for round wires in PEEC

✍ Scribed by Ruehli, Albert E.; Antonini, Giulio; Jiang, Lijun

Book ID: 127215381
Publisher: IEEE
Year: 2012
Weight: 577 KB
Category: Article
ISBN: 1467307165
DOI: 10.1109/emceurope.2012.6396927

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