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[IEEE 2012 International Symposium on Computer, Consumer and Control (IS3C) - Taichung, Taiwan (2012.06.4-2012.06.6)] 2012 International Symposium on Computer, Consumer and Control - Drift Region Effects of Power MOSFETs

โœ Scribed by You, Hsin-Chiang; Wu, Cheng-Yen; Lin, Yu-Hsien; Yang, Wen-Luh


Book ID
118236286
Publisher
IEEE
Year
2012
Weight
306 KB
Category
Article
ISBN
0769546552

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