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[IEEE 2012 International Symposium on Biometrics and Security Technologies (ISBAST) - Taipei, Taiwan (2012.03.26-2012.03.29)] 2012 International Symposium on Biometrics and Security Technologies - Improving Fault Tolerance through Crash Recovery

โœ Scribed by Yeh, Tsozen; Cheng, Weian


Book ID
115542468
Publisher
IEEE
Year
2012
Weight
489 KB
Volume
0
Category
Article
ISBN
076954696X

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