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[IEEE 2012 International SoC Design Conference (ISOCC 2012) - Jeju Island, Korea (South) (2012.11.4-2012.11.7)] 2012 International SoC Design Conference (ISOCC) - Impact of fin thickness and height on read stability / write ability in tri-gate FinFET based SRAM

✍ Scribed by Junha Lee, ; Hanwool Jeong, ; Younghwi Yang, ; Jisu Kim, ; Seong-Ook Jung,

No coin nor oath required. For personal study only.

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