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[IEEE 2012 International Conference on Optoelectronics and Microelectronics (ICOM) - Changchun, Jilin, China (2012.08.23-2012.08.25)] 2012 International Conference on Optoelectronics and Microelectronics - The experiment of a system for measurements of the refractive index structure constant along a 1 km free-space laser propagation path

✍ Scribed by Ren, Zhipeng; Cui, Guangcai; Chen, Chunyi

Book ID: 120163219
Publisher: IEEE
Year: 2012
Weight: 606 KB
Category: Article
ISBN: 1467326372
DOI: 10.1109/ICoOM.2012.6316280

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