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[IEEE 2012 International Conference on Optoelectronics and Microelectronics (ICOM) - Changchun, Jilin, China (2012.08.23-2012.08.25)] 2012 International Conference on Optoelectronics and Microelectronics - Modeling of substrate coupling noise in lightly doped mixed-signal ICs

✍ Scribed by Wang, Yongsheng; Liu, Shanshan; Li, Fang; Lai, Fengchang; Yu, Mingyan

Book ID: 115543220
Publisher: IEEE
Year: 2012
Weight: 673 KB
Category: Article
ISBN: 1467326372
DOI: 10.1109/icoom.2012.6316320

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