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[IEEE 2012 International Conference on Measurement, Information and Control (MIC) - Harbin, China (2012.5.18-2012.5.20)] Proceedings of 2012 International Conference on Measurement, Information and Control - A high-quality and high-speed system of Bayer image restoration controlled by DM642 and FPGA

✍ Scribed by Yang, Haoyu; Wang, Lei; Chen, Shenghua; Yuan, Lingling; Pan, Xuan; Ge, Manling

Book ID: 118258301
Publisher: IEEE
Year: 2012
Weight: 993 KB
Category: Article
ISBN: 1457716038
DOI: 10.1109/mic.2012.6273439

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