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[IEEE 2012 International Conference on High Voltage Engineering and Application (ICHVE) - Shanghai, China (2012.09.17-2012.09.20)] 2012 International Conference on High Voltage Engineering and Application - Aging phenomenon of 15 kV EPR cable insulation by electrical and thermal stress

✍ Scribed by Cao, L.; Grzybowski, S.

Book ID: 125510903
Publisher: IEEE
Year: 2012
Weight: 353 KB
Category: Article
ISBN: 1467347450
DOI: 10.1109/ICHVE.2012.6357084

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