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[IEEE 2012 International Conference on High Voltage Engineering and Application (ICHVE) - Shanghai, China (2012.09.17-2012.09.20)] 2012 International Conference on High Voltage Engineering and Application - Analysis of the breakdown fault in field voltage withstand test of 500kV SF6 current transformer

✍ Scribed by Yongji Zhang, ; Yongming Wang, ; Haitao Huang, ; Guoshun Zheng, ; Zhijin Zhang,

Book ID: 121325759
Publisher: IEEE
Year: 2012
Weight: 285 KB
Category: Article
ISBN: 1467347450
DOI: 10.1109/ICHVE.2012.6357040

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