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[IEEE 2012 International Conference on High Voltage Engineering and Application (ICHVE) - Shanghai, China (2012.09.17-2012.09.20)] 2012 International Conference on High Voltage Engineering and Application - Electric field measurement and analysis around a line model at different voltage levels

✍ Scribed by Kocatepe, C.; Arikan, O.; Kumru, C.F.; Erduman, A.; Umurkan, N.

Book ID: 120895138
Publisher: IEEE
Year: 2012
Weight: 318 KB
Category: Article
ISBN: 1467347450
DOI: 10.1109/ICHVE.2012.6357005

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