[IEEE 2012 International Conference on D
โฆ LIBER โฆ
[IEEE 2012 International Conference on Devices, Circuits and Systems (ICDCS 2012) - Coimbatore (2012.03.15-2012.03.16)] 2012 International Conference on Devices, Circuits and Systems (ICDCS) - Variable gate oxide thickness MOSFET: A device level solution for sub-threshold leakage current reduction
โ Scribed by Keerti Kumar, K.; Bheema Rao, N.
- Book ID
- 126984675
- Publisher
- IEEE
- Year
- 2012
- Weight
- 590 KB
- Category
- Article
- ISBN
- 1457715449
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