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[IEEE 2012 International Conference on Devices, Circuits and Systems (ICDCS 2012) - Coimbatore (2012.03.15-2012.03.16)] 2012 International Conference on Devices, Circuits and Systems (ICDCS) - A technique for low power testing of VLSI chips

✍ Scribed by Jayagowri, R.; Gurumurthy, K. S.

Book ID: 120182915
Publisher: IEEE
Year: 2012
Weight: 716 KB
Category: Article
ISBN: 1457715449
DOI: 10.1109/ICDCSyst.2012.6188654

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