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[IEEE 2012 International Caribbean Conference on Devices, Circuits and Systems (ICCDCS) - Playa del Carmen, Mexico (2012.03.14-2012.03.17)] 2012 8th International Caribbean Conference on Devices, Circuits and Systems (ICCDCS) - Study of the spatial distribution of breakdown spots in MOS devices in case of important edge effect anomalies

✍ Scribed by Miranda, E.; Sune, J.; Mahata, C.; Das, T.; Maiti, C. K.

Book ID: 126594661
Publisher: IEEE
Year: 2012
Weight: 243 KB
Category: Article
ISBN: 145771115X
DOI: 10.1109/ICCDCS.2012.6188892

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