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[IEEE 2012 IEEE/MTT-S International Microwave Symposium - MTT 2012 - Montreal, QC, Canada (2012.06.17-2012.06.22)] 2012 IEEE/MTT-S International Microwave Symposium Digest - Wireless impedance measurement of UHF RFID tag chips

✍ Scribed by Huan-Yang Chen, ; Yue Weng Mak, ; Sangchul Bae, ; Bhadkamkar, Atul; van der Weide, Daniel W.

Book ID: 121454792
Publisher: IEEE
Year: 2012
Weight: 524 KB
Category: Article
ISBN: 1467310867
DOI: 10.1109/MWSYM.2012.6259369

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