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[IEEE 2012 IEEE/MTT-S International Microwave Symposium - MTT 2012 - Montreal, QC, Canada (2012.06.17-2012.06.22)] 2012 IEEE/MTT-S International Microwave Symposium Digest - Harmonics induced uncertainty in phase noise measurements

✍ Scribed by Calbaza, Dorin; Gupta, Chandra; Rohde, Ulrich L.; Poddar, Ajay K.

Book ID: 115506558
Publisher: IEEE
Year: 2012
Weight: 658 KB
Category: Article
ISBN: 1467310867
DOI: 10.1109/mwsym.2012.6258417

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