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[IEEE 2012 IEEE/MTT-S International Microwave Symposium - MTT 2012 - Montreal, QC, Canada (2012.06.17-2012.06.22)] 2012 IEEE/MTT-S International Microwave Symposium Digest - Scaling of X-parameters for device modeling

✍ Scribed by Root, D. E.; Marcu, M.; Horn, J.; Xu, J.; Biernacki, R. M.; Iwamoto, M.

Book ID: 115483565
Publisher: IEEE
Year: 2012
Weight: 762 KB
Category: Article
ISBN: 1467310867
DOI: 10.1109/mwsym.2012.6259679

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