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[IEEE 2012 IEEE Topical Meeting on Silicon Monolithic Integrated Circuits in Rf Systems (SiRF) - Santa Clara, CA, USA (2012.01.16-2012.01.18)] 2012 IEEE 12th Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems - High resolution imaging of few-layer graphene by Near-Field Scanning Microwave Microscopy

✍ Scribed by Monti, Tamara; Di Donato, Andrea; Farina, Marco

Book ID: 127273529
Publisher: IEEE
Year: 2012
Weight: 531 KB
Category: Article
ISBN: 1457713160
DOI: 10.1109/sirf.2012.6160156

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