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[IEEE 2012 IEEE Topical Meeting on Silicon Monolithic Integrated Circuits in Rf Systems (SiRF) - Santa Clara, CA, USA (2012.01.16-2012.01.18)] 2012 IEEE 12th Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems - A new method to analyze the behavior of SiGe:C HBTs under RF large signal stress

✍ Scribed by Wipf, Christian

Book ID: 120659328
Publisher: IEEE
Year: 2012
Weight: 191 KB
Category: Article
ISBN: 1457713160
DOI: 10.1109/SiRF.2012.6160152

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