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[IEEE 2012 IEEE-NPSS Real Time Conference (RT 2012) - Berkeley, CA, USA (2012.06.9-2012.06.15)] 2012 18th IEEE-NPSS Real Time Conference - Study of radiation damage in front-end electronics components

✍ Scribed by Higuchi, Takeo; Nakao, Mikihiko; Itoh, Ryosuke; Suzuki, Soh Y.; Nakano, Eiichi

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