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[IEEE 2012 IEEE International Symposium on Software Reliability Engineering Workshops (ISSREW) - Dallas, TX, USA (2012.11.27-2012.11.30)] 2012 IEEE 23rd International Symposium on Software Reliability Engineering Workshops - Targeting Specific Customer Satisfactions Issues with ODC Analysis

✍ Scribed by Chillarege, Ram

Book ID: 124081469
Publisher: IEEE
Year: 2012
Weight: 102 KB
Category: Article
ISBN: 0769549284
DOI: 10.1109/ISSREW.2012.105

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