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[IEEE 2012 IEEE International Symposium on Radio-Frequency Integration Technology (RFIT) - Singapore, Singapore (2012.11.21-2012.11.23)] 2012 IEEE International Symposium on Radio-Frequency Integration Technology (RFIT) - Theoretical study of short channel effect in highly scaled GaN HEMTs

✍ Scribed by Sun, Haifeng; Lee, Kean Boon; Yuan, Li; Wang, Weizhu; Selvaraj, Susai Lawrence; Lo, Guo-Qiang

Book ID: 121323163
Publisher: IEEE
Year: 2012
Weight: 257 KB
Category: Article
ISBN: 1467323047
DOI: 10.1109/RFIT.2012.6401661

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