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[IEEE 2012 IEEE International Symposium on Hardware-Oriented Security and Trust (HOST) - San Francisco, CA, USA (2012.06.3-2012.06.4)] 2012 IEEE International Symposium on Hardware-Oriented Security and Trust - Reliability enhancement of bi-stable PUFs in 65nm bulk CMOS

✍ Scribed by Bhargava, Mudit; Cakir, Cagla; Mai, Ken

Book ID: 126729745
Publisher: IEEE
Year: 2012
Weight: 869 KB
Category: Article
ISBN: 146732339X
DOI: 10.1109/HST.2012.6224314

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