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[IEEE 2012 IEEE International Symposium on Electrical Insulation (ISEI) - San Juan, PR, USA (2012.06.10-2012.06.13)] 2012 IEEE International Symposium on Electrical Insulation - Investigations on the dielectric strength of syntactic foam at cryogenic temperature and the impact of the filler material on the volume shrinkage

✍ Scribed by Winkel, D.; Schnettler, A.

Book ID: 121820901
Publisher: IEEE
Year: 2012
Weight: 615 KB
Category: Article
ISBN: 1467304867
DOI: 10.1109/ELINSL.2012.6251537

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