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[IEEE 2012 IEEE International Symposium on Electrical Insulation (ISEI) - San Juan, PR, USA (2012.06.10-2012.06.13)] 2012 IEEE International Symposium on Electrical Insulation - Defect investigation in medium-voltage EPR cable

✍ Scribed by Reid, Alistair J.; Hu, Xiao; Judd, Martin D.; Siew, W. H.

Book ID: 115438715
Publisher: IEEE
Year: 2012
Weight: 383 KB
Category: Article
ISBN: 1467304867
DOI: 10.1109/elinsl.2012.6251482

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