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[IEEE 2012 IEEE International Symposium on Circuits and Systems - ISCAS 2012 - Seoul, Korea (South) (2012.05.20-2012.05.23)] 2012 IEEE International Symposium on Circuits and Systems - Digital background calibration of redundant split-flash ADC in 45nm CMOS

✍ Scribed by Majidi, Rabeeh; Crasso, Anthony; McNeill, John A.

Book ID: 118273409
Publisher: IEEE
Year: 2012
Weight: 937 KB
Category: Article
ISBN: 1467302171
DOI: 10.1109/iscas.2012.6271469

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