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[IEEE 2012 IEEE International Solid- State Circuits Conference - (ISSCC) - San Francisco, CA, USA (2012.02.19-2012.02.23)] 2012 IEEE International Solid-State Circuits Conference - A 0.7e−rms-temporal-readout-noise CMOS image sensor for low-light-level imaging

✍ Scribed by Chen, Yue; Xu, Yang; Chae, Youngcheol; Mierop, Adri; Wang, Xinyang; Theuwissen, Albert

Book ID: 111879930
Publisher: IEEE
Year: 2012
Weight: 202 KB
Volume: 0
Category: Article
ISBN: 1467303755
DOI: 10.1109/isscc.2012.6177059

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