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[IEEE 2012 IEEE International Solid- State Circuits Conference - (ISSCC) - San Francisco, CA, USA (2012.02.19-2012.02.23)] 2012 IEEE International Solid-State Circuits Conference - Capacitive-coupling wordline boosting with self-induced VCC collapse for write VMIN reduction in 22-nm 8T SRAM

โœ Scribed by Kulkarni, Jaydeep; Geuskens, Bibiche; Karnik, Tanay; Khellah, Muhammad; Tschanz, James; De, Vivek


Book ID
111879189
Publisher
IEEE
Year
2012
Weight
548 KB
Volume
0
Category
Article
ISBN
1467303755

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