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[IEEE 2012 IEEE International SOI Conference - Napa, CA, USA (2012.10.1-2012.10.4)] 2012 IEEE International SOI Conference (SOI) - RF SOI CMOS technology on commercial trap-rich high resistivity SOI wafer

✍ Scribed by Ben Ali, K. (author);Roda Neve, C. (author);Gharsallah, A. (author);Raskin, J. P. (author)

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