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[IEEE 2012 IEEE International SOI Conference - Napa, CA, USA (2012.10.1-2012.10.4)] 2012 IEEE International SOI Conference (SOI) - Evaluation of sSOI wafers for 22nm node and beyond

✍ Scribed by Allibert, F.; Cheng, K.; Vinet, M.; Schwarzenbach, W.; Khakifirooz, A.; Ecarnot, L.; Nguyen, B. Y.; Doris, B.

No coin nor oath required. For personal study only.

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