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[IEEE 2012 IEEE International Conference on Oxide Materials for Electronic Engineering (OMEE) - Lviv, Ukraine (2012.09.3-2012.09.7)] 2012 IEEE International Conference on Oxide Materials for Electronic Engineering (OMEE) - Admittance and photoadmittance spectroscopy of zinc oxide layers grown on p-Si substrates by sol-gel and spin coating method

✍ Scribed by Popielarski, P.; Bala, W.; Paprocki, K.

Book ID: 121397966
Publisher: IEEE
Year: 2012
Weight: 130 KB
Category: Article
ISBN: 1467344923
DOI: 10.1109/OMEE.2012.6464849

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