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[IEEE 2012 IEEE International Conference on Industrial Technology (ICIT 2012) - Athens (2012.03.19-2012.03.21)] 2012 IEEE International Conference on Industrial Technology - Test generation for large automotive models

✍ Scribed by Venkatesh, R.; Shrotri, U.; Darke, P.; Bokil, P.

Book ID: 111879907
Publisher: IEEE
Year: 2012
Weight: 332 KB
Category: Article
ISBN: 1467303410
DOI: 10.1109/icit.2012.6210014

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