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[IEEE 2012 IEEE International Conference on Cyber Technology in Automation, Control, and Intelligent Systems (CYBER) - Bangkok (2012.05.27-2012.05.31)] 2012 IEEE International Conference on Cyber Technology in Automation, Control, and Intelligent Systems (CYBER) - Test effectiveness index: Integrating product metrics with process metrics

โœ Scribed by Yan Zhang, ; Xuying Zhao, ; Xiaokun Zhang, ; Tian Zhang,


Book ID
126706570
Publisher
IEEE
Year
2012
Weight
138 KB
Category
Article
ISBN
1467314196

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