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[IEEE 2012 IEEE Fifth International Conference on Software Testing, Verification and Validation (ICST) - Montreal, QC, Canada (2012.04.17-2012.04.21)] 2012 IEEE Fifth International Conference on Software Testing, Verification and Validation - Using Mutants to Locate "Unknown" Faults

✍ Scribed by Papadakis, Mike; Le Traon, Yves

Book ID: 118161075
Publisher: IEEE
Year: 2012
Weight: 423 KB
Category: Article
ISBN: 1457719061
DOI: 10.1109/icst.2012.159

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