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[IEEE 2012 IEEE Energy Conversion Congress and Exposition (ECCE) - Raleigh, NC, USA (2012.09.15-2012.09.20)] 2012 IEEE Energy Conversion Congress and Exposition (ECCE) - Junction temperature measurement of IGBTs using short circuit current

✍ Scribed by Xu, Zhuxian; Wang, Fred; Ning, Puqi

Book ID: 120075333
Publisher: IEEE
Year: 2012
Weight: 840 KB
Category: Article
ISBN: 1467308013
DOI: 10.1109/ECCE.2012.6342837

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