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[IEEE 2012 IEEE Custom Integrated Circuits Conference - CICC 2012 - San Jose, CA, USA (2012.09.9-2012.09.12)] Proceedings of the IEEE 2012 Custom Integrated Circuits Conference - Impact of subthreshold hump on bulk-bias dependence of offset voltage variability in weak and moderate inversion regions

✍ Scribed by Sakakibara, K.; Kumamoto, T.; Arimoto, K.

Book ID: 118054629
Publisher: IEEE
Year: 2012
Weight: 231 KB
Category: Article
ISBN: 1467315540
DOI: 10.1109/cicc.2012.6330574

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