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[IEEE 2012 IEEE Custom Integrated Circuits Conference - CICC 2012 - San Jose, CA, USA (2012.09.9-2012.09.12)] Proceedings of the IEEE 2012 Custom Integrated Circuits Conference - A 0.015mm2 63fJ/conversion-step 10-bit 220MS/s SAR ADC with 1.5b/step redundancy and digital metastability correction

✍ Scribed by Vitek, R.; Gordon, E.; Maerkovich, S.; Beidas, A.

Book ID: 117990236
Publisher: IEEE
Year: 2012
Weight: 1010 KB
Category: Article
ISBN: 1467315540
DOI: 10.1109/cicc.2012.6330696

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